Exhibitor Workshops & Seminars

Agilent Technologies Workshops
Free to Attend
Room: Dante

For more information, program details and registration: http://www.agilent.com/find/EuMW2005

Resonant Cavity Materials Measurement
Tuesday 4th October 2005, 09.30 – 12.30

This half-day workshop will cover techniques using a resonant cavity and network analyzer for measuring complex permittivity and loss tangent of dielectric materials. Understanding these parameters is becoming increasingly important in electronics, communications, and radar applications as frequency increases and clock speed decreases to meet the demands of the future. Resonant techniques offer the improved accuracy and resolution needed for ceramic substrate, thin film, printed circuit board, radome and other advanced materials. Setup and measurement is easy and quick, and depending on material form and resonant cavity method chosen, measurements can even be non-destructive.

Topics will include:
1. Overview and theory of resonant cavity methods.
2. Methods for determining resonant frequency and Q of the cavity.
3. System hardware and sample considerations.
4. Hands-on measurement demo.

8 Hints for Better Spectrum Analysis
Tuesday 4th October 2005, 14.00 – 17.30

How do you perform today's most demanding spectrum measurements which require optimization for sensitivity, dynamic range, sweep speed, accuracy or all of them? With traditional swept-tuned super heterodyne spectrum analyzers, an emphasis on one parameter oftentimes puts pressure on the others. But with the incorporation of Digital Signal Processing (DSP) into Agilent's modern spectrum analyzers, the trade-offs can be minimized while at the same time gaining improvements in accuracy. In this workshop, techniques with corresponding demonstrations will be presented on how to set the spectrum analyzer settings to optimize for sensitivity when measuring very low-level signals, how to exploit the analyzer's full dynamic range for distortion measurements, how to minimize the sweep times when capturing transient signals, and how to resolve the spectrum of modulated pulsed RF carriers. The demonstrations will be done using the Agilent PSA High Performance Spectrum Analyzer.

Differential and Balanced Devices: Measurement and Simulation Techniques
Wednesday 5th October, 09.30 – 12.30

This workshop presents the latest work in measurements on balanced or differential devices. Topics include a brief introduction to mixed mode S-parameters, followed by advanced topics including embedding, impedance transformation and matching. Solutions to the problem of designing and calibrating PC Board fixtures will be particularly addressed. Advanced measurements such as differential gain compression will be presented, along with some surprising results comparing mixed-mode gain compression measurements derived from both single-ended and true-balanced drive. Particular difficulties with errors in true-balanced drive will be introduced. Differential noise figure will be discussed from a definitional point of view. Finally, simulation techniques using ADS will be presented which demonstrate how to evaluate measured and simulated results for differential parameters.

Integrated RF and Microwave Design with ADS 2005A
Wednesday 5th October, 14.00 – 17.30

Designing a high-frequency system, either for aerospace and defence or commercial communications applications requires the ability to work at different levels of abstraction. At a higher level, the entire system is partitioned into RF, analog and digital subsystems. The RF portion is then divided into functional blocks, each with its specifications. Each block is designed at the electrical level, then at the physical level. Last but not least, prior to fabrication, the design needs to be verified and then exported to manufacturing equipment.

This workshop presents a methodology for designing one of these systems, from the higher levels of abstraction down to the physical layout and verification. We will particularly focus on a number of capabilities available within Agilent's Advanced Design System (ADS) that enable such integrated concept-to-fabrication design methodology and result in a significant increase in design productivity. In the course of this workshop, we will also discuss recent advancements in simulation and EM technology that are available in the new release 2005A of ADS.

Who should attend?
This workshop is intended for engineers and first-level managers who are involved with the design and development of RF and Microwave circuits and subsystems.

Generation and Analysis of Signals for High Performance Radar and Electronic Warfare Systems
Thursday 6th October 2005, 09.30 – 12.30

Development of today's sophisticated radar systems requires advanced simulation and measurement techniques in order to evaluate performance under all operating modes and to ensure specifications are fully characterized. Vector signal generators utilizing I/Q modulation provide more flexible radar signal generation using standard off-the-shelf products than was previously possible using analog techniques. These tools, in combination with ultra-high bandwidth oscilloscopes, high performance spectrum and vector signal analyzers, and continuously sampling power meters, make extremely accurate signal creation and analysis easier than ever.

This workshop will include both theory and guided labs. We will review the fundamentals of creating and analyzing radar signals with traditional tools such as spectrum analyzers and signal sources, then graduate to more advanced vector signal generation and analysis techniques using new high performance ultra-wide bandwidth tools. The applications shown will include the capture and playback of unique waveforms and techniques for obtaining the best signal quality for vector-modulated signals through waveform correction of linear and non-linear anomalies in the test set-up. We will also discuss advanced topics in the creation and analysis of phase coherent signals for applications such as direction finding, beam forming, and geo-location.

Audience: design and test engineers working on radar and EW systems

Advancements in mm-wave On-Wafer S-Parameter Verification
Thursday, 6 October, 14:00 - 17:30 (Cascade Microtech)

This workshop is presented in two modules.

Firstly, the design of on-wafer verification devices is discussed and recommendations for layout suggested. Selection of S-parameter correction techniques up to 220GHz are examined and contrasted. Improvements in statistical techniques to control variations in vector corrections are illustrated.

The second module presents new capabilities which offer improved measurement repeatability and calibration in the WR-10 through WR-5 waveguide bands. New types of membrane tips to 220GHz and a membrane waveguide-to-coax transition have been developed. These elements are incorporated in a family of wafer probes with improved repeatability and calibration throughout the waveguide bands. Both simulation and measurement results will be presented in the workshop. 

CST – Computer Simulation Technology
Free to Attend
Room: Ambroisie 4

For more information, program details and registration, come and visit us on stand 507, or visit our website: www.cst.com

Complete Technology – Workshop on 3D EM Simulation
Tuesday 4th October, 14:30 – 16:30, language: English

Modern 3D EM simulation tools offer benefits such as shorter and more cost effective development cycles through automatic optimisation and parameter studies. Virtual prototyping radically reduces cut-and-try iterations in your design process.

This workshop will present CST's Complete Technology approach to simulation:

  • 3D EM simulation using CST MICROWAVE STUDIO™ (CST MWS)

  • an introduction to CST STUDIO SUITE™'s DESIGN ENVIRONMENT

  • comparison of methods: Time and Frequency Domain, hexahedral and tetrahedral meshing

  • live demonstrations

  • workflow integration and Agilent ADS link

  • application examples

Complete Technology - Séminaire dédié à la simulation EM 3D
Mercredi 5 octobre, 10:00 - 12:00, langue: Français

Les outils de simulation EM 3D d'aujourd'hui permettent de réduire les temps de cycle de développement et ainsi d'en réduire les coûts associés grâce aux fonctions d'optimisation et d'étude paramétrique. Le prototypage virtuel vous permet de limiter considérablement le nombre de passes maquette – mise au point dans votre processus de conception.

Ce Séminaire présente l'approche technologique complète de CST de la simulation :

  • Simulation 3D EM avec CST MICROWAVE STUDIO™ (CST MWS)

  • Introduction à CST STUDIO SUITE™'s DESIGN ENVIRONMENT

  • Comparaison des méthodes: Domaines Temporel et Fréquentiel, maillage

  • hexaédrique et tétraédrique

  • Démonstration en direct

  • Intégration à l'environnement de conception et lien avec Agilent ADS

  • Exemples d'application

CST Advanced User Workshop
Wednesday 5th October, 14:00 – 17:00, language: English

Customers and testers of CST MICROWAVE STUDIO™ (CST MWS) & CST DESIGN STUDIO™ (CST DS) are invited to participate in CST's advanced user workshop at EuMW 2005. This meeting will present:

  • an in-depth look at CST STUDIO SUITE™ 2006

  • new features in CST MWS 2006

  • tips on the advanced use of CST MWS & CST DS

  • an introduction to CST STUDIO SUITE™'s DESIGN ENVIRONMENT

  • discussion

About CST

CST is one of the two largest suppliers of electromagnetic simulation software and has continuously enhanced its position as market and technology leader in 3D Time Domain simulation. With over 80 employees worldwide and a network of qualified distributors, 120 people are dedicated to the development and support of its EM products in more than 30 countries. Information about CST is available on the web at www.cst.com.

CADFEKO TRAINING
Language: English
Room: Dante

Friday 7th October, 9:00 – 16:00

FEKO is a general purpose electromagnetics solver package, see www.feko.info for details. With the latest July 2005 release of FEKO Suite 5.0 a graphical CAD component CADFEKO was added. This workshop is aimed at existing FEKO users to familiarise themselves with this new component CADFEKO. New FEKO users or engineers interested in FEKO are also welcome.

After the basic principles have been introduced the attendees will have time to use the different functions of CADFEKO such as geometry construction, meshing, etc. under guidance and assistance of the training presenters. Advanced topics such as local mesh refinement, creation of parametric models will also be presented in tutorials.

LATEST ADVANCEMENTS IN ACTIVE HF COMPONENT AND CIRCUIT CHARACTERIZATION
Room: Azorin

Tuesday 4th October, 14:00 – 17:30

This workshop wants to achieve two goals. First the workshop wants to provide practical information of the latest different products and how they can be seamlessly combined to characterize different aspects of HF components and circuits. Secondly the workshop explains you the different latest characterization techniques that will allow you to get faster and better insight in the complex behavior of your components.

Amongst others, an overview is given of different probing techniques for single-ended and differential applications together with the calibration aspects. It is shown how integration of probes and tuners lead to accurate source – and load – pull measurements and how these measurements can be made available and used in simulation tools.

Finally it is shown how it is possible to characterize active HF components (diodes, transistors, power amplifiers etc...) in their small – signal (S-parameters) and large – signal behavior (harmonics, intermodulation, pulsed under different impedance conditions) with one measurement system making only one connection.